2024

Vol.31 No.3

Editorial Office

Review

  • Journal of the Microelectronics and Packaging Society
  • Volume 27(1); 2020
  • Article

Review

Journal of the Microelectronics and Packaging Society 2020;27(1):1-7. Published online: May, 26, 2020

High-temperature Semiconductor Bonding using Backside Metallization with Ag/Sn/Ag Sandwich Structure

  • Jinseok Choi andSung Jin An
    Department of Advanced Materials Science and Engineering, Kumoh National Institute of Technology
Corresponding author E-mail: sungjinan@kumoh.ac.kr
Abstract

The backside metallization process is typically used to attach a chip to a lead frame for semiconductor packaging because it has excellent bond-line and good electrical and thermal conduction. In particular, the backside metal with the Ag/Sn/Ag sandwich structure has a low-temperature bonding process and high remelting temperature because the interfacial structure composed of intermetallic compounds with higher melting temperatures than pure metal layers after die attach process. Here, we introduce a die attach process with the Ag/Sn/Ag sandwich structure to apply commercial semiconductor packages. After the die attachment, we investigated the evolution of the interfacial structures and evaluated the shear strength of the Ag/Sn/Ag sandwich structure and compared to those of a commercial backside metal (Au-12Ge).

Keywords backside metallization, die attach, Ag/Sn/Ag sandwich structure, high-temperature semiconductor, soldering