2024

Vol.31 No.2

Editorial Office

Review

  • Journal of the Microelectronics and Packaging Society
  • Volume 30(1); 2023
  • Article

Review

Journal of the Microelectronics and Packaging Society 2023;30(1):49-54. Published online: May, 11, 2023

Development Trend of Ni-less Surface Treatment Technology for Semiconductor Packaging Substrates

  • Min-Kyo Cho1, Jin-Ki Cho1, Kyoung-Min Kim1,†, Sung Yong Kim2, Deok-Gon Han3, and Tae-Hyun Sung3
    1 Department of Material Engineering, Tech University of Korea, 237. Sangidaehak-ro, Siheung-si, Gyeonggi-do, Korea, 2 Dept. of Electronics Eng., Tech University of Korea, 237. Sangidaehak-ro, Siheung-si, Gyeonggi-do, Korea, 3 MK Chem & Tech Co., Ltd, 167 Sanseong-ro, Danwon-gu, Ansan-si, Gyeonggi-do, 15434 Korea
Corresponding author E-mail: kkm386@tukorea.ac.kr
Abstract

Recently, System in Packaging(SIP) technology needs to meet high frequency (5G and more) communication technology and fine pitch surface treatment. The conventional Electroless Ni/Immersion Au plating(ENIG) is not suitable for high frequency range because of magnetic properties are increasing the transmission loss. Without nickel plating layer, the pattern and pad reliability level must be meet the condition. In this review paper, we investigated research trends on Ni-less surface treatment technology for high-frequency communication and frequency characteristics according to materials.

Keywords SiP, Transmission Loss, Surface Finish Technology, EPIG, DEG, Magnetic Properties

REFERENCES
  • D. Cullen, B. Kline, G. Moderhock, and L. Gatewood, "Effects of Surface Finish on High Frequency signal loss using Various Substrate Materials", MacDermid, Inc., (2000)
  • Y. Tomita, Q. Wu, A. Maeda, S. Baba, and N. Ueda, "Advanced surface plating on the organic FCBGA package", in IEEE ECTC 2000, 861-867 (2000)
  • C. E. Ho, T. T. Kuo, W. Gierlotka, and F. M. MA, "Development and Evaluation of Direct Deposition of Au,Pd(P) Bilayers over Cu Pads in Soldering Applications", J. Electronic Materials, 41(12), 3276-3283 (2012) https://doi.org/10.1007/s11664-012-2200-9
  • Y. G. Jung, M. J. Lee, S. W. Park, D. S. Ryu, Y. S. Jung, C. H. Hwang, C. H. Lee, S. S. Park, M. Jimarez, and M. J. Lee, "Development of Large Die Fine Pitch Flip Chip BGA using TCNCP Technology", in IEEE 2012, 439-443 (2012)
  • M. J. Lee, C. C. Lim, and P. T. Teh, "Packaging Technology and Design Challenges for Fine Pitch Cu Pillar and BOT (Bond on Trace) using Thermal Compression Bonding", 36th International Electronic Manufacturing Technology Conference, 15216609 (2014)
  • A. Gross and N. Sitte, "Nickel free final finishes in the electronics industry", in IMAPS/EMPC, (2015)
  • K. Shah, "Reliable Nickel-Free Surface Finish Solution for High-Frequency, HDI PCB Applications", J. Microelectron. Electron. Packag., 17(4), 121-127 (2020) https://doi.org/10.4071/imaps.1227802
  • A. Gross and N. Sitte, "Nickel-Free Final Finishes in the Electronics Industry", 2015 European Microelectronics Packaging Conference (EMPC), 1-4 (2015)
  • D. Baudrand and J. Bengston, "Electroless Plating Processes: Developing Technologies for Electroless Nickel, Palladium and Gold", Metal Finishing, 93(9), 55-57 (1995) https://doi.org/10.1016/0026-0576(95)99502-2
  • H. O. Ali and I. R. A. Christie, "A Review of Electroless Gold Deposition Processes", Gold Bulletin, 17, 118-127 (1984) https://doi.org/10.1007/BF03214674
  • Y. Okinaka, "An Electrochemical Study of Electroless GoldDeposition Reaction", J. Electrochem. Soc., 120(6), 739 (1973)
  • Y. Tao and F. Scharf, "Revisiting the Effect of Nickel Characteristics on High-Speed Interconnect Performance", IEEE Transactions on Microwave Theory and Techniques, 64(8), 2447-2453 (2016) https://doi.org/10.1109/TMTT.2016.2586943
  • J. Y. Hur, C. M. Lee, S. B. Koo, J. M. Jeon, and H. K. Lee, "A Study on Electroless Palladium Layer Characteristics and Its Diffusion in the Electroless Palladium Immersion Gold (EPIG) Surface Treatment for Fine Pitch Flip Chip Package", J. Korean Inst. Surf. Eng., 50(3), 170-176 (2017) https://doi.org/10.5695/JKISE.2017.50.3.170
  • B. Rautio and J. Coonrod, "An Efficient EM Simulation Model for ENIG Plated Metal Finishes Including Conductor Side-Wall Plating Verified With Physical Measurement from 1 to 50 GHz", 2018 IEEE MTT-S International Microwave Workshop Series on 5G Hardware and System Technologies (IMWS-5G), 18149259 (2018)
  • P. Seiler and D. Plettemeier, "Measurement of PCB Surface Finishes for Substrate Characterization up to 67 GHz", 2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, 18403070 (2018)
  • Y. H. Huang, W. Z. Hsieh, P. T. Lee, Y. S. Wu, T. T. Kuo, and C. E. Ho, "Reaction of Au,Pd,Cu and Au,Pd,Au,Cu multilayers with Sn Ag Cu alloy", Surface & Coatings Technology, 358, 753-761 (2019) https://doi.org/10.1016/j.surfcoat.2018.11.085
  • A. Ippich, "PCB Surface Finish Impact to Losses at High Frequencies", 2019 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS), 19279817 (2019)
  • I. Y.-E. Su, C.-H. Huang, C. Hansen, and Y.-S. Lin, "The investigation of the correlation between Electroless Nickel Immersion Gold and High-speed Signal Transmission", 2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 20237805 (2020)
  • S.-Y. Jun, J.-H. Bang, M.-S. Kim, D.-G. Han, T.-Y. Lee, and S. Yoo, "Thermo-Compression Bonding of Cu/SnAg Pillar Bumps with Electroless Palladium Immersion Gold (EPIG) Surface Finish", Materials, 16(4), 1739 (2023)
  • T.-Y. Lee, "A study on low thermal expansion coefficient silane-modified non-conductive adhesive (NCA) and Ni-free surface finish for fine-pitch flip-chip thermo-compression bonding", in Ph. D. Hanyang University, Seoul (2022)