2024

Vol.31 No.2

Editorial Office

Review

  • Journal of the Microelectronics and Packaging Society
  • Volume 30(3); 2023
  • Article

Review

Journal of the Microelectronics and Packaging Society 2023;30(3):51-55. Published online: Nov, 9, 2023

Improvement of Precision in Ferroelectric Polarization Hysteresis Measurement

  • Jae Hwan Park
    Department of Electronic Engineering, Korea National University of Transportation, Chungju, 308-702, Korea
Corresponding author E-mail: pjh@ut.ac.kr
Abstract

Measurement of the ferroelectric polarization hysteresis curve is an important means of overall evaluation and interpretation of the ferroelectric structure and dielectric properties. If a resistive component is included in the ferroelectric sample, an error is included in the measured value of the spontaneous polarization. When configuring the electrical circuit to measure the polarization, by properly utilizing the external resistance corresponding to the resistive component included in the sample, the error due to the resistive loss of the sample was excluded and the size of the ferroelectric polarization induced inside could be accurately measured. It is expected that the displacement and dielectric characteristics of ions inside the ferroelectric can be more accurately evaluated through the evaluation of such an accurate polarization hysteresis curve

Keywords Polarization, Hysteresis, Ferroelectrics, Error correction

REFERENCES
  • B. Jaffe, W. R. Cook Jr., and H. Jaffe, "Piezoelectric Ceramics", Academic Press, London and New York (1971).
  • T. Kamiya, T. Suzuki, T. Tsurumi and M. Daimon, "Effects of Manganese Addition on Piezoelectric Properties of Pb(Zr0.5Ti0.5)O3", Jpn. J. Appl. Phys., 31(9S), 3058 (1992).
  • S. L. Swartz, T. R. Shrout, W. A. Schulze, and L. E. Cross, "Dielectric Properties of Lead Magnesium Niobate Ceramics", J. Am. Ceram. Soc., 67(5), 311-314 (1984).
  • J. G. Lim, J. H. Park, J. Lee and S. G. Lee, "Effect of Temperature and Compressive Stress on the Dielectric and Piezoelectric Properties of PIN-PMN-PT Single Crystal", J. Microelectron. Packag. Soc., 26(4), 63-28 (2019).
  • J. G. Lim, J. H. Park, J. Lee and S. G. Lee, "The 33-mode Dielectric and Piezoelectric Properties of PIN-PMN-PT Single Crystal under Stress and Electric Field", J. Microelectron. Packag. Soc., 27(4), 91-96 (2020).