2024

Vol.31 No.2

Editorial Office

Review

  • Journal of the Microelectronics and Packaging Society
  • Volume 30(4); 2023
  • Article

Review

Journal of the Microelectronics and Packaging Society 2023;30(4):69-78. Published online: Feb, 20, 2024

MAGICal Synthesis: Memory-Efficient Approach for Generative Semiconductor Package Image Construction

  • Yunbin Chang1 , Wonyong Choi2 , and Keejun Han1†
    1School of Computer Engineering, Hansung University, 116, Samseongyo-ro 16-gil, Seongbuk-gu, Seoul, Republic of Korea, 2R&D Center, Genesem, 24, Songdogwahak-ro 84beon-gil, Yeonsu-gu, Incheon, Republic of Korea
Corresponding author E-mail: keejun.han@hansung.ac.kr
Abstract

With the rapid growth of artificial intelligence, the demand for semiconductors is enormously increasing everywhere. To ensure the manufacturing quality and quantity simultaneously, the importance of automatic defect detection during the packaging process has been re-visited by adapting various deep learning-based methodologies into automatic packaging defect inspection. Deep learning (DL) models require a large amount of data for training, but due to the nature of the semiconductor industry where security is important, sharing and labeling of relevant data is challenging, making it difficult for model training. In this study, we propose a new framework for securing sufficient data for DL models with fewer computing resources through a divide-and-conquer approach. The proposed method divides high-resolution images into pre-defined sub-regions and assigns conditional labels to each region, then trains individual sub-regions and boundaries with boundary loss inducing the globally coherent and seamless images. Afterwards, full-size image is reconstructed by combining divided sub-regions. The experimental results show that the images obtained through this research have high efficiency, consistency, quality, and generality.

Keywords Data Augmentation, Generative Adversarial Networks, Artificial Intelligence, Performance Optimization

REFERENCES
  • T. Y. Kang and T. S. Kim, "Signal-Based Fault Detection and Diagnosis on Electronic Packaging and Applications of Artificial Intelligence Techniques", J. Microelectron. Packag. Soc., 30(1), 30-41 (2023).
  • H. J. Kim and J. P. Jung, "Artificial Intelligence Semiconductor and Packaging Technology Trend", J. Microelectron. Packag. Soc., 30(3), 11-19 (2023).
  • D. W. Park and M. H. Yu, "A Study on Effect of Pad Design on Assembly and Adhesion Reliability of Surface Mount Technology (SMT)", J. Microelectron. Packag. Soc., 29(3), 31-35 (2022).
  • B. Dey, D. Goswami, S. Halder, K. Khalil, P. Leray, and M. A. Bayoumi, "Deep Learning-Based Defect Classification and Detection in SEM Images", in Metrology, Inspection, and Process Control XXXVI, SPIE, p. PC120530Y (2022).
  • V. De Ridder, B. Dey, S. Halder, and B. Van Waeyenberge, "SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation", 2023 International Symposium ELMAR, IEEE, 61-66 (2023).
  • T. Karras, T. Aila, S. Laine, and J. Lehtinen, "Progressive Growing of GANs for Improved Quality, Stability, and Variation", arXiv preprint arXiv:1710.10196 (2017)
  • S. P. Porkodi, V. Sarada, V. Maik, and K. Gurushankar, "Generic Image Application Using GANs (Generative Adversarial Networks): A Review", Evolving Systems, 14(5), 903-917 (2023).
  • I. Goodfellow, J. Pouget-Abadie, M. Mirza, B. Xu, D. Warde-Farley, S. Ozair, and Y. Bengio, "Generative Adversarial Nets", Advances in Neural Information Processing Systems, 27 (2014).
  • M. Mirza and S. Osindero, "Conditional Generative Adversarial Nets", arXiv preprint arXiv:1411.1784 (2014).
  • A. Odena, C. Olah, and J. Shlens, "Conditional Image Synthesis with Auxiliary Classifier GANs", in International Conference on Machine Learning, PMLR, 2642-2651 (2017).
  • A. Radford, L. Metz, and S. Chintala, "Unsupervised Representation Learning with Deep Convolutional Generative Adversarial Networks", arXiv preprint arXiv:1511.06434 (2015).
  • H. Liu, B. Li, H. Wu, H. Liang, Y. Huang, Y. Li, and Y. Zheng, "Combating Mode Collapse in GANs via Manifold Entropy Estimation", arXiv preprint arXiv:2208.12055 (2022).
  • M. Arjovsky, S. Chintala, and L. Bottou, "Wasserstein Generative Adversarial Networks", in International Conference on Machine Learning, PMLR, 214-223 (2017).
  • I. Gulrajani, F. Ahmed, M. Arjovsky, V. Dumoulin, and A. C. Courville, "Improved Training of Wasserstein GANs", Advances in Neural Information Processing Systems, 30 (2017).
  • H. Zhang, I. Goodfellow, D. Metaxas, A. Odena, "Self-Attention Generative Adversarial Networks", in International Conference on Machine Learning, PMLR, 7354-7363 (2019).
  • A. Brock, J. Donahue, and K. Simonyan, "Large Scale GAN Training for High Fidelity Natural Image Synthesis", arXiv preprint arXiv:1809.11096 (2018).
  • P. Isola, J. Y. Zhu, T. Zhou, and A. A. Efros, "Image-to-Image Translation with Conditional Adversarial Networks", in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 1125-1134 (2017).
  • W. Cheng, M. Zhao, Z. Ye, and S. Gu, "MFAGAN: A Compression Framework for Memory-Efficient On-Device Super-Resolution GAN", arXiv preprint arXiv:2107.12679 (2021).
  • D. Tantawy, M. Zahran, and A. Wassal, "A Survey on GAN Acceleration Using Memory Compression Techniques", Journal of Engineering and Applied Science, 68, 1-23 (2021).
  • K. He, X. Zhang, S. Ren, and J. Sun, "Deep Residual Learning for Image Recognition", in Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, 770-778 (2016).
  • Y. Gao, Y. Liu, H. Zhang, Z. Li, Y. Zhu, H. Lin, M. Yang, "Estimating GPU Memory Consumption of Deep Learning Models", in Proceedings of the 28th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 1342-1352 (2020).
  • M. Heusel, H. Ramsauer, T. Unterthiner, B. Nessler, and S. Hochreiter, "GANs Trained by a Two Time-Scale Update Rule Converge to a Local Nash Equilibrium", Advances in Neural Information Processing Systems, 30 (2017).
  • T. Karras, S. Laine, and T. Aila, "A Style-Based Generator Architecture for Generative Adversarial Networks", in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 4401-4410 (2019).