2024

Vol.31 No.2

Editorial Office

Review

  • Journal of the Microelectronics and Packaging Society
  • Volume 25(4); 2018
  • Article

Review

Journal of the Microelectronics and Packaging Society 2018;25(4):155-161. Published online: Feb, 1, 2019

Flip Chip Process on the Local Stiffness-variant Stretchable Substrate for Stretchable Electronic Packages

  • Donghyeun Park, Tae Sung Oh
    Department of Materials Science and Engineering, Hongik University
Corresponding author E-mail: ohts@hongik.ac.kr
Abstract

강성도가 서로 다른 polydimethylsiloxane (PDMS) 탄성고분자와 flexible printed circuit board (FPCB)로 이루어진 PDMS/FPCB 구조의 강성도 국부변환 신축기판에 100 μm 직경의 Cu/Au 범프를 갖는 Si 칩을 anisotropic conductive adhesive (ACA)를 사용하여 플립칩 본딩 후, ACA내 전도성 입자에 따른 플립칩 접속저항을 비교하였다. Au 코팅된 폴리머 볼을 함유한 ACA를 사용하여 플립칩 본딩한 시편은 43.2 mΩ의 접속저항을 나타내었으며, SnBi 솔더입자를 함유한 ACA로 플립칩 본딩한 시편은 36.2 mΩ의 접속저항을 나타내었다. 반면에 Ni 입자를 함유한 ACA를 사용하여 플립칩 본딩한 시편에서는 전기적 open이 발생하였는데, 이는 ACA내 Ni 입자의 함유량이 부족하여 entrap된 Ni 입자가 하나도 없는 플립칩 접속부가 발생하였기 때문이다.
A Si chip with the Cu/Au bumps of 100-μm diameter was flip-chip bonded using different anisotropic conductive adhesives (ACAs) onto the local stiffness-variant stretchable substrate consisting of polydimethylsiloxane (PDMS) and flexible printed circuit board (FPCB). The average contact resistances of the flip-chip joints processed with ACAs containing different conductive particles were evaluated and compared. The specimen, which was flip-chip bonded using the ACA with Au-coated polymer balls as conductive particles, exhibited a contact resistance of 43.2 mΩ. The contact resistance of the Si chip, which was flip-chip processed with the ACA containing SnBi solder particles, was measured as 36.2 mΩ, On the contrary, an electric open occurred for the sample bonded using the ACA with Ni particles, which was attributed to the formation of flip-chip joints without any entrapped Ni particles because of the least amount of Ni particles in the ACA.

Keywords stretchable packaging, stretchable substrate, PDMS, FPCB, flip chip, contact resistance.